PlanOpSim has used a number of optical techniques for characterization and parameter extraction from thin film materials. The most important optical parameters extracted are:
-
Refractive index and absorption coefficient
-
Haze and transmission
-
Optical retardation of birefringent materials
-
Film thickness
-
Transmission and reflection
PlanOpSim can help you with these techniques:
- Spectroscopic Ellipsometry: is the reference method for determining the refractive index of thin films.
- Optical retardation measurements using a Babinet compensator: the most accurate method to determine the retardation factor of a birefringent film.
- Transmission and reflection spectrometry: is an alternative method to determine the refractive index and asbsorption coefficient. Generally thicker films are needed than in ellipsometric measurements
- Haze & Transmission: Haze is an important experimental parameter for scattering and structured films. The measurement must be carefully conducted with an integrating sphere.
