PlanOpSim has used a number of optical techniques for characterization and parameter extraction from thin film materials. The most important optical parameters extracted are:
Refractive index and absorption coefficient
Haze and transmission
Optical retardation of birefringent materials
Transmission and reflection
Thin film characterization techniques recquire parameter fitting to extract material parameters from measured transmitted and reflected signals. We build a parametrized model of the wavelength-dependendent refractive index, extra-ordinairy axis, layers and their thickness. The parameters are then varied to find the best fit to measured data. The fit can be performed on multiple measurements and/or multiple samples. The more data, the more reliable the extracted parameters will be.
PlanOpSim can help you with these techniques:
Spectroscopic Ellipsometry: is the reference method for determining the refractive index of thin films.
Optical retardation measurements using a Babinet compensator: the most accurate method to determine the retardation factor of a birefringent film.
Transmission and reflection spectrometry: is an alternative method to determine the refractive index and asbsorption coefficient. Generally thicker films are needed than in ellipsometric measurements
Haze & Transmission: Haze is an important experimental parameter for scattering and structured films. The measurement must be carefully conducted with an integrating sphere.